Surfaces analysis techniques - KAMA8M20

Informations générales

  • Number of hours

    • Lectures 8.0
    • Projects -
    • Tutorials -
    • Internship -
    • Laboratory works -
    • Written tests 1.0

    ECTS

    ECTS 0.15

Goal(s)

Detailed study of some characterization techniques (MEIS, XPS and local probe microscopy) used as tools for surface and thin film control. This teaching is illustrated by numerous application examples.

Content(s)

1 Orders of magnitude in Surface Physics and Vacuum Physics. Instrumentations: sources, analysers and detectors
2 Physics of MEIS. Applications to the study of materials and structures.
3 XPS, physics and applications.
4 Local probe microscopies, physics and applications.

Prerequisites

Notions of solid-state physics and quantum mechanics. Common mathematical tools.

Calendar

The course exists in the following branches:

  • Curriculum - MAT - Semester 8

Additional Information

Course ID : KAMA8M20
Course language(s): FR

You can find this course among all other courses.

Bibliography

L.C. Feldman et J.W. Mayer, Fundamentals of surface and thin film analysis (North-Holland, New-York, 1984).